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3D Measurement for Semiconductor Applications

By R&D Editors | August 28, 2014

Koh Young Technology and Koh Young America have procuded the HORUS, a high-powered 3D measurement system.

The system can measure the volume and dimension of virtually any type of substance, part, component, or die, including very small features. HORUS can also precisely measure transparent and shiny materials with high speed and accuracy. The unit helps realize higher yields in semiconductor and advanced packaging applications by measuring objects that have been considered difficult to measure with appreciable speed, without sacrificing accuracy.

HORUS is capable of precisely measuring transparent objects at production speeds. It is suitable for the full range of electronics manufacturing and assembly applications including board-level SMT. HORUS can measure shiny objects including flux and solder balls using its very wide Field of View (FOV) optics. The combination of wide FOV and quick inspection speed allows HORUS to be used as an in-line inspection machine. This will also facilitate lot testing on all products, rather than traditional sampling inspection due to slow inspection speeds.

Koh Young Technology

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