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Analysis of contaminations on a plastic part using the FT-IR microscope LUMOS

By R&D Editors | July 12, 2012

Analysis of contaminations on a plastic part using the FT-IR microscope LUMOS

Analysis of contaminations on a plastic part using the FT-IR microscope LUMOS

BrukerWhitePaper-AN101-250Bruker’s
LUMOS microscope is equipped with a motorized attenuated total
reflectance (ATR) germanium objective that is highly suitable for
analysis of dark samples without the need for preparation. In this white
paper from Bruker Optics, the analysis of dark streaks on a
polycarbonate sample is simplified through the use of automation
procedures.

Download White Paper

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