Field Emission Electron Microscope
The JEM-2100F is a Field Emission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. Features include a high-brightness Schottky field emission electron gun producing a probe size of less than 0.15nm. Ultra-high point-to-point TEM resolution is guaranteed at 0.19nm, and atomic scale resolution of 0.136nm can be achieved using High Angle Annular Dark Field (HAADF) STEM imaging to directly reveal atomic position and detail. To perform atomic-level stage movements, this microscope features a tension-free specimen holding system and a five-axis, LoDrift goniometer stage. Drift is guaranteed at less than 0.2nm/min.