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Focal plane arrays enable FT-IR microscopy

By R&D Editors | February 23, 2012

 

Focal plane arrays enable FT-IR microscopy

The recent addition in recent years of focal plane array detectors to Fourier transform infrared (FT-IR) spectrometers has allowed the instrument to obtain much richer spectra, up to 16,000 pixels/spectra simultaneously. The heightened capabilities have positioned FT-IR to assume a greater role in a variety of laboratory imaging tasks traditionally reserve for conventional microscopes. A new white paper from Bruker Optics describes some of these applications.

Download White Paper

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