STN AnaVist 2.0

STN AnaVist analysis and visualization software analyzes search results from the multidisciplinary CAplus database and the patent databases USPATFULL and PCTFULL, as well as from Derwent World Patents Index. The software works with STN Express 8.2 to analyze content from the STN online service, offering searching capabilities coupled with a seamless transition to analysis and visualization. Features include clustering fields, such as Technology Indicators, Exemplary/First Claim, All Claims and International Patent Classification codes, as well as customizable visualization using combinations of text fields. A variety of bar charts can be created based on DWPI Class, DWPI Manual Codes, Labels and Patent Country Codes/Kind Codes. Document highlighting features and up to eight simultaneous highlighting colors to compare multiple data sets, and 2-D displays allow for white or black backgrounds.