Nenovision’s LiteScope 2.5 represents an inventive AFM-in-SEM technology, especially for nanoscale analysis. Its unique integration of Atomic Force Microscopy (AFM) and Scanning Force Microscopy (SEM) capabilities allows site-specific, multimodal correlative analysis, making advanced research accessible to various industries. Key features include self-sensing probe technology, seamless SEM integration without modifications, and AI-driven image correlation, enhancing precision,…