VK-X3000 3D Surface Profiler
Established in 1963, the R&D 100 Awards is the only S&T (science and technology) awards competition that recognizes new commercial products, technologies, and materials for their technological significance that are available for sale or license. The R&D 100 Awards, celebrating the program's 60th Anniversary this year, has long been a benchmark of excellence for industry sectors as diverse as telecommunications, high-energy physics, software, manufacturing, and biotechnology. This 2022 R&D 100 winner is listed below, along with its respective category.
Category: Analytical/Test
Developers: Keyence Corporation of America
United States
Product Description:The VK-X3000 is a non-contact metrology system designed to provide profile, roughness, and film thickness measurements on any type of material. By combining three different measurement principles, the system allows users to capture nanometer, micrometer, and millimeter measurements on any sample.
Developers: Keyence Corporation of America
United States
Product Description:The VK-X3000 is a non-contact metrology system designed to provide profile, roughness, and film thickness measurements on any type of material. By combining three different measurement principles, the system allows users to capture nanometer, micrometer, and millimeter measurements on any sample.
VK-X3000