VK-X3000 3D Surface Profiler
Category: Analytical/Test
Developers: Keyence Corporation of America
United States
Product Description:The VK-X3000 is a non-contact metrology system designed to provide profile, roughness, and film thickness measurements on any type of material. By combining three different measurement principles, the system allows users to capture nanometer, micrometer, and millimeter measurements on any sample.
Developers: Keyence Corporation of America
United States
Product Description:The VK-X3000 is a non-contact metrology system designed to provide profile, roughness, and film thickness measurements on any type of material. By combining three different measurement principles, the system allows users to capture nanometer, micrometer, and millimeter measurements on any sample.
VK-X3000