XPM – Accelerated Property Mapping, which won a 2016 R&D 100 award, sets a new industry standard in terms of nanomechanical testing throughput paired with measurement resolution and accuracy. With XPM, more data can be taken in a single afternoon than could be collected in an entire year using traditional nanoindentation methodologies. These exclusive performance capabilities are made possible by the coupling and optimization of three industry-leading Hysitron technologies: a high bandwidth electrostatically actuated transducer, fast control and data acquisition electronics, and top-down in-situ SPM imaging.
These synchronized technologies have the ability to perform six nanoindentation measurements/second to rapidly achieve comprehensive quantitative nanomechanical property maps, greatly increase measurement confidence through robust property distribution statistics, accelerate mandatory system calibrations, and enable reliable nanomechanical testing at elevated temperatures.
Each year for more than 50 years, R&D Magazine has honored the 100 best innovations in research and development. We are currently accepting applications for the 2017 R&D 100 Awards. Innovators with an exceptional product developed between January 1, 2016 and March 31, 2017 should apply. Submissions close April 14, 2017
For information on the 55th Annual R&D 100 Awards and to enter visit http://www.rd100conference.com