Source Measure Test Cards
Two multi-channel source-measure test cards with expanded operating ranges for the Model 4500-MTS Multi-Channel I-V Test System are avaiable. Each Model 4510- and Model 4511-QIVC (Quad I-V Card) provides four source-measure channels in each of nine slots of the Model 4500-MTS PCI mainframe, allowing up to 36 I-V measurement channels. The cards can make these measurements in a fraction of the time and at a fraction of the cost of a comparable rack-and-stack system. The Model 4500-MTS is used for automated testing in multi-head (multi-DUT) production test environments, such as those involving stress-measure, life testing, and general device characterization. Typical applications employ its fast source-measure capabilities to generate I-V curves, measure the resistance of DUTs such as MEMSs and circuit protection diodes, and characterize many other passive and active devices. The system is also useful as a multi-channel power supply for sourcing and measuring voltages or currents during functional test of devices such as RFICs and photonic ICs.