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Multi-element detectors greatly accelerate FT-IR image acquisition

By R&D Editors | February 21, 2012

 

Multi-element detectors greatly accelerate FT-IR image acquisition

Infrared spectroscopy has been used in combination with traditional microscopy for more than 25 years, but has always been extremely time-consuming, requiring hours to resolve a sample area less than one square millimeter. The addition of multi-element detectors, along with Fourier transform technology, as described in a recent Bruker Optics white paper, enables a detection to assess all points on an image simultaneously, saving considerable time.

Download White Paper

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