Research & Development World

  • R&D World Home
  • Topics
    • Aerospace
    • Automotive
    • Biotech
    • Careers
    • Chemistry
    • Environment
    • Energy
    • Life Science
    • Material Science
    • R&D Management
    • Physics
  • Technology
    • 3D Printing
    • A.I./Robotics
    • Software
    • Battery Technology
    • Controlled Environments
      • Cleanrooms
      • Graphene
      • Lasers
      • Regulations/Standards
      • Sensors
    • Imaging
    • Nanotechnology
    • Scientific Computing
      • Big Data
      • HPC/Supercomputing
      • Informatics
      • Security
    • Semiconductors
  • R&D Market Pulse
  • R&D 100
    • 2025 R&D 100 Award Winners
    • 2025 Professional Award Winners
    • 2025 Special Recognition Winners
    • R&D 100 Awards Event
    • R&D 100 Submissions
    • Winner Archive
  • Resources
    • Research Reports
    • Digital Issues
    • Educational Assets
    • R&D Index
    • Subscribe
    • Video
    • Webinars
    • Content submission guidelines for R&D World
  • Global Funding Forecast
  • Top Labs
  • Advertise
  • SUBSCRIBE

Simurgh

Category: Other
Developers: Oak Ridge National Laboratory


Product Description:Simurgh, an AI-based XCT framework, accelerates the scanning speed of nondestructive characterization of high-density (and other) metals by 12 times, with four times the resolution and six times improvement in flaw detection over industry-standard techniques. Simurgh saves costs, increases productivity, and eliminates the need for extensive data curation. Covered by US 17/392,645, ORNL ID 202004647, Simurgh Improves defect detection capabilities by four times, according to Oak Ridge National Laboratory. Simurgh has reliably demonstrated that it can identify flaws as small as 50 µm–100 µm. It lowers operational costs by reducing scan times, the need for extensive post-processing and manual input, and associated labor costs. It is also applicable across various industries including aerospace, automotive, biomedical, electronics, and advanced manufacturing. ORNL also highlights its scalability, noting that it facilitates high-throughput evaluation and testing, making it ideal for Industry 4.0 applications.


Back to full list of 2025 R&D Winners
Research & Development World
  • Subscribe to R&D World Magazine
  • Sign up for R&D World’s newsletter
  • Contact Us
  • About Us
  • Drug Discovery & Development
  • Pharmaceutical Processing
  • Global Funding Forecast

Copyright © 2026 WTWH Media LLC. All Rights Reserved. The material on this site may not be reproduced, distributed, transmitted, cached or otherwise used, except with the prior written permission of WTWH Media
Privacy Policy | Advertising | About Us

Search R&D World

  • R&D World Home
  • Topics
    • Aerospace
    • Automotive
    • Biotech
    • Careers
    • Chemistry
    • Environment
    • Energy
    • Life Science
    • Material Science
    • R&D Management
    • Physics
  • Technology
    • 3D Printing
    • A.I./Robotics
    • Software
    • Battery Technology
    • Controlled Environments
      • Cleanrooms
      • Graphene
      • Lasers
      • Regulations/Standards
      • Sensors
    • Imaging
    • Nanotechnology
    • Scientific Computing
      • Big Data
      • HPC/Supercomputing
      • Informatics
      • Security
    • Semiconductors
  • R&D Market Pulse
  • R&D 100
    • 2025 R&D 100 Award Winners
    • 2025 Professional Award Winners
    • 2025 Special Recognition Winners
    • R&D 100 Awards Event
    • R&D 100 Submissions
    • Winner Archive
  • Resources
    • Research Reports
    • Digital Issues
    • Educational Assets
    • R&D Index
    • Subscribe
    • Video
    • Webinars
    • Content submission guidelines for R&D World
  • Global Funding Forecast
  • Top Labs
  • Advertise
  • SUBSCRIBE