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Pilot certification examinations to be held during metrology conference

By R&D Editors | April 18, 2012

The
Coordinate Metrology Society (CMS), the eminent membership association
for measurement professionals, announced today it will host a series of
“pilot” certification examinations at their 28th annual Coordinate
Metrology Systems Conference (CMSC), July 16-20, 2012,  at The Roosevelt
Hotel in New Orleans, La. The CMS Certification Committee will conduct
pilot examinations free of charge each day during the five-day event.
Conference attendees, both experts and novices, are encouraged to test
their general knowledge of portable 3D metrology and contribute to the
success of the first level-one Certification program in the industry.

In
2009, the CMS Certification Committee began work toward a personnel
certification program. This year’s pilot examinations are the final step
in a rigorous process to create an academically sound and legally
defensible assessment. The test results will be used to validate and
weigh the examination questions, and determine a cut-score. Participants
will not be graded and will not receive certification upon conclusion
of the examination.

CMS members will also review the eligibility requirements for the certification and provide feedback during the conference.

In
the past three years, the dedicated CMS Certification Committee has
drafted a core body of knowledge and identified the American Society of
Photogrammetry and Remote Sensing (ASPRS) as their partner organization
to support the certification effort. Formal documents defining roles,
responsibilities, authority, and accountability have been crafted and
reviewed by each organization’s Executive Committees. The Coordinate
Metrology Society expects to have an industry-recognized, level-one
personnel certification in portable 3D metrology by the end of 2012, and
later plans to deploy a level-two equipment-specific certification that
would include laser trackers, area scanners, laser radars, hand-held
scanners and data post processing.

Coordinate Metrology Systems Conference

Source: Coordinate Metrology Society

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