Affordable Laser-free Retrofittable Stroboscopic Solution for Ultra-fast Electron Microscopy
Category: Analytical/Test
Developers: Euclid TechLabs, LLC
Co-Developers: JEOL USA Inc. Brookhaven National Laboratory NIST
United States
Product Description:An affordable solution that retrofits and upgrades existing commercial TEM into an Ultrafast Electron Microscope. We use advanced RF technologies to modulate and chop the electron beam into picosecond electron pulses with repetition rates up to 10 GHz. Duty cycle and repetition rate are continuously tunable.
Developers: Euclid TechLabs, LLC
Co-Developers: JEOL USA Inc. Brookhaven National Laboratory NIST
United States
Product Description:An affordable solution that retrofits and upgrades existing commercial TEM into an Ultrafast Electron Microscope. We use advanced RF technologies to modulate and chop the electron beam into picosecond electron pulses with repetition rates up to 10 GHz. Duty cycle and repetition rate are continuously tunable.
Figure1_TEM_EMMP.jpg